XT-1200
High speed AXI system for sensor inspection
Description
Automatic X-ray inspection system designed for the high-speed inspection of pressure sensors. The system can be easily embedded into the sensor production process for 100% control. Additional inspection technologies (e.g. AOI) are available and can be integrated to the inspection process.
X-ray System Features
- High speed AXI system (Inline/Offline)
- Sensor inspection with automatic defect detection and defect verification capability
- Super High-resolution Scintillator Camera
Microfocus X-ray source (sealed)
standard:
120kV/40W
120kV/40W
optional:
100KV/20W
100KV/20W
Detector
standard:
CMOS Flatpanel Detector
(14 bit, 1k x 1k, 75 µm)
CMOS Flatpanel Detector
(14 bit, 1k x 1k, 75 µm)
optional:
XEye 20 X-ray detector
200 x 200 mm2
XEye 40 X-ray detector
400 x 200 mm2
XEye 20 X-ray detector
200 x 200 mm2
XEye 40 X-ray detector
400 x 200 mm2
Applications
Inspection Technologies
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