XS-Series
High Resolution
Inline AXI platform
Description
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
X-ray System Features
- High speed AXI system with minimum footprint for inline setups
- Microfocus / Submicron X-ray tube (sealed tube / maintenance free)
- Resolution down to <1µm
- Multiple programmable motion system with servo drives
- Digital CMOS flatpanel detector
- Automatic grey-level and geometrical calibration
- Full product traceability via customized MES-Interface
Highlights
- Same-side load/unload configuration
- Barcode scanner for serial number and product type selection
- Auto BCR scanning station (x-y gantry)
- Low dose radiation filter
Available Setups
- SMT setup for component and solder-joint inspection on PCB, hybrid or chip level assembly processes
- Semi-Backend setup for semiconductor applications, wire bond Test (pre & post), light & complex PCB’s and flex circuits
Available Configurations
Depending on the type of product & inspection task- XS-2 Transmission (2D) + SFT™
- XS-2.5 Transmission (2D) + SFT™ + Off-Axis (2.5D)
- XS-3 Transmission (2D) + SFT™ + Off-Axis (2.5D) + 3D SART